Cart (Loading....) | Create Account
Close category search window
 

Estimating infarct severity from the ECG using a realistic heart model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
van Dam, P.M. ; Radboud Univ. Med. Center, Nijmegen, Netherlands ; Dijk, W.A. ; van der Putten, N.H. ; Maan, A.C.
more authors

The early phase of myocardial infarction is accompanied by changes in the ST segment of the ECG. This makes the ST segment the clinical marker for the detection of acute myocardial infarction. The determination of the infarct severity, location and size of the myocardial tissue at risk will support clinical decision making. In this study we used an inverse procedure to estimate the location and size of the infarcted heart region. The method estimates the local transmembrane amplitude based on the ECG amplitude near the J-point of the standard 12 leads signals using a patient specific volume conductor model. For the 5 available patient cases the positions as well as the size of the estimated infarct region were in accordance with results based on MRI.

Published in:

Computing in Cardiology (CinC), 2012

Date of Conference:

9-12 Sept. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.