Referenced Items are not available for this document.
Large-signal or non-linear characterization of transistor devices is essential for determining their performance in such non-linear applications as power amplifiers (PAs), considering the limitations of linear S-parameter characterization techniques in such applications. Load-pull is one of the most frequently used techniques for estimating and optimizing device performance in the non-linear domain.
Published in:
Instrumentation & Measurement Magazine, IEEE
(Volume:16
,
Issue:
1
)
Date of Publication: February 2013
- Page(s):
- 30 - 36
- ISSN :
- 1094-6969
- INSPEC Accession Number:
- 13250672
- Digital Object Identifier :
- 10.1109/MIM.2013.6417055
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 24 January 2013
- Issue Date :
- February 2013
- Sponsored by :
- IEEE Instrumentation and Measurement Society
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