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This paper studies performance and timing failure probability of time-shifted redundant circuits and replica circuits. Measurement-based experiments using a fabricated test chip are performed. For an approximately similar false positive error probability for time-shifted redundant circuits and replica circuits, the false negative error probability of time-shifted redundant circuits is approximately two orders of magnitude less than that of the replica circuits. When attaining a false negative error of zero, time-shifted redundant circuits achieves one order of magnitude less in false positive error probability than that of the replica circuits.
Date of Conference: 5-7 Dec. 2012