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Call for papers: Special Issue on Variability and Aging

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IEEE Design & Test of Computers seeks original manuscripts for a special issue on the "Variability and Aging" topic, scheduled for publication in November/December 2013. This special issue will cover recent works on variability and aging, including modeling circuit techniques, and innovative monitoring and countermeasure mechanisms at the circuit, micro-architectural, and system level to mitigate variability and improve reliability.

Published in:

Design & Test of Computers, IEEE  (Volume:29 ,  Issue: 5 )