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Guest Editors' introduction: On-chip structures for smarter silicon

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2 Author(s)
Tehranipoor, M. ; Electrical and Computer Engineering Dept., University of Connecticut, Storrs, ; Winemberg, L.

This special issue presents novel on-chip structures for monitoring aging and variations in the circuit, analyzing circuit operation condition's impact on aging and performance degradation, agingaware power/performance tuning, interoperability and optimization for SerDes, and finally using onchip power monitors for detection of hardware Trojans in integrated circuits. Five papers were selected for publication in this special issue.

Published in:

Design & Test of Computers, IEEE  (Volume:29 ,  Issue: 5 )

Date of Publication:

Oct. 2012

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