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Distributed grating sensors using low-coherence reflectometry

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3 Author(s)
M. Volanthen ; Optoelectron. Res. Centre, Southampton Univ., UK ; H. Geiger ; J. P. Dakin

Distributed grating sensors have recently been interrogated with low-coherence reflectometry. Initial results have been enhanced using two new and versatile configurations. The first system tracks the wavelength using a closed-loop scheme, while the second system scans the distance using an open-loop approach. Arbitrary strain and temperature profiles along gratings have been examined with 300 μm spatial resolution and 5.4 με/√Hz accuracy. A theoretical model of the interrogation technique is derived and the predicted performance limits are examined experimentally

Published in:

Journal of Lightwave Technology  (Volume:15 ,  Issue: 11 )