Cart (Loading....) | Create Account
Close category search window

Performance Evaluation of SPECT Imaging System for Sediment Column Imaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Vandehey, N.T. ; Lawrence Berkeley Nat. Lab., Berkeley, CA, USA ; Boutchko, R. ; Druhan, J.L. ; O'Neil, J.P.
more authors

The performance of a SPECT imaging system for imaging vertically oriented glass columns (10 cm diameter x 30 cm long) has been evaluated in terms of spatial resolution, image uniformity, and linearity. This imaging system was developed to support research in environmental geosciences by determining flow patterns in heterogeneous porous media (e.g., sediment) through simultaneous monitoring of sediment chemistry and flow parameters. Using a Derenzo-like hot-rod phantom, rods down to 7.9 mm diameter were resolved. Flood images had an integral uniformity of 8.5% and differential uniformity of 6.2% in the center of the field of view. The ratio of total detected counts to the mean image reconstructed value was within 2% of linear over a range of greater than two orders of magnitude of counts.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:60 ,  Issue: 2 )

Date of Publication:

April 2013

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.