Cart (Loading....) | Create Account
Close category search window
 

Semiclassical model of semiconductor laser noise and amplitude noise squeezing. I. Description and application to Fabry-Perot laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Vey, J.-L. ; Dept. Commun., Ecole Nat. Superieure des Telecommun., Paris, France ; Gallion, P.

A semiclassical model of semiconductor laser noise, based on the Green's function method, is used to derive analytical formulas for the amplitude and frequency noise spectra taking into account incoming vacuum fluctuations and noise due to internal loss. This formalism also takes into account phenomena such as gain suppression as well as spatial hole burning (SHB). The amplitude noise squeezing is studied for Fabry-Perot structures pointing out the influence of the laser structural parameters. A complete agreement with already existing quantum mechanical models is found. However, extension of the model to SHB induces limitations in the squeezing performances, which are very important for more complex structures as will be pointed out in detail, in Part II

Published in:

Quantum Electronics, IEEE Journal of  (Volume:33 ,  Issue: 11 )

Date of Publication:

Nov 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.