Close category search window
 

Bees algorithm for degree-constrained minimum spanning tree problem

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
1 Author(s)
Malik, M. ; Dept. of Comput. of Sci. & Inf. Technol., Gurgaon Coll. of Eng., Gurgaon, India

The problem of identifying a minimum spanning tree (MST) of a connected, undirected graph is a classical combinatorial optimization problem which can be solved efficiently in polynomial time by greedy heuristics. But, there are several practically relevant variants of MST problem that have been shown to be NP-complete. One of the variants of MST considered in this work is degree-constrained spanning tree. Recently, most of the works on this problem focus on heuristics that can find good solutions in a reasonable amount of time. In this paper, we have proposed an approach based on bees algorithm procedure to handle the degree constrained problem. A travel salesman problem is considered and a set of 2-degree spanning trees are extracted from the graph and supplied to the proposed algorithm. A bees algorithm-based approach is carried out to optimize the spanning trees based on their cost values. The fitness function points the cost effective degree constrained spanning tree. Experimentation of the proposed approach is carried out on a traveling salesman problem. The results showed that the proposed approach has produces cost effective and time effective results.

Published in:
Computing and Communication Systems (NCCCS), 2012 National Conference on

Date of Conference: 21-22 Nov. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.