Cart (Loading....) | Create Account
Close category search window
 

Cross sections of operating Cu(In,Ga)Se2 thin-film solar cells under defined white light illumination analyzed by Kelvin probe force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Zhang, Zhenhao ; Light Technology Institute, Karlsruhe Institute of Technology (KIT), Kaiserstr. 12, 76131 Karlsruhe, Germany ; Hetterich, Michael ; Lemmer, Uli ; Powalla, Michael
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.4775679 

The contact potential of cross sections of operating Cu(In,Ga)Se2 thin-film solar cells is analyzed by Kelvin probe force microscopy under defined illumination intensities with white light. The potential drop through the solar cell heterojunction is found to decrease with increasing illumination intensity up to flat-band conditions and the decrease of the potential drop correlates with the increase of the photovoltage induced by the illumination. Interestingly, we observe that potential variations at Cu(In,Ga)Se2 grain boundaries decrease to less than 50 mV under illumination. With this finding, the often claimed beneficial effect of Cu(In,Ga)Se2 grain boundaries is critically discussed.

Published in:

Applied Physics Letters  (Volume:102 ,  Issue: 2 )

Date of Publication:

Jan 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.