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We measure and investigate the relationship between well potential perturbation and multiple cell upsets (MCUs) by neutron irradiation. Area-efficient cell-based perturbation detectors are placed adjacent to FFs (Flip-Flops). They can measure duration time of perturbation with 5 μm spatial resolution at two voltage levels. The measurement results by neutron irradiation on a 65-nm bulk CMOS show that 95% of MCUs occur simultaneously with well-potential perturbation, while there is very weak relationship between single event upsets (SEUs) and the perturbation.