Cart (Loading....) | Create Account
Close category search window
 

Statistical analysis of surface roughness measurements using laser speckle images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jeyapoovan, T. ; Dept. of Mech. Eng., Hindustan Inst. of Technol. & Sci., Chennai, India ; Murugan, M. ; Bovas, B.C.

Stylus profilers are still used as a successful method for surface roughness measurement in spite of its stylus tip diameter that acts as a low pass filter on steep valley on rough surfaces. The setup and operation time for surface measurements using a stylus profiler is considerably high. Hence a reliable non-contact optical technique for surface measurements has good potential for surface measurements based on the availability of a powerful CCD camera and fast processing digital computers. When a rough surface is illuminated with a coherent laser source, a speckle image is formed due to the scattering of light rays on the rough surface. The speckle pattern thus obtained can be used for surface roughness measurements. The contrast of the speckle image is processed to evaluate the surface roughness using the surface image parameters. Statistical parameters such as mean, variance, standard deviation, skew and kurtosis were used to analyze surface roughness using the pixel intensity of the surface images. Milled and ground surface specimens were used, and the images obtained were processed using MATLAB software.

Published in:

Information and Communication Technologies (WICT), 2012 World Congress on

Date of Conference:

Oct. 30 2012-Nov. 2 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.