Cart (Loading....) | Create Account
Close category search window

Electrical modelling and design insight of a vertically movable gate field effect transistor for physical sensor applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Williams, J.M. ; Ingram Sch. of Eng., Texas State Univ., San Marcos, TX, USA ; Cole, B.S. ; Byoung Hee You ; Heung Seok Kang
more authors

A novel electrical modelling for a vertically movable gate field effect transistor (VMGFET) for sensing applications is conducted. Presented is the manipulation of threshold voltage and drain current of the VMGFET as a function of the effective charge density and the air gap between the gate and the substrate body. The usage of the VMGFET in depletion mode, while operating in the saturation region, is proposed to prevent an electrostatic attraction between the suspended gate and substrate and to have a linear response of drain current over a varying air gap. The sensitivity of the VMGFET is simulated and shows a constant slope by changing the air gap under the operating conditions, such as working in depletion mode and operating in the saturation region. The sensitivity independence of the gate position is desirable when the VMGFET is applied for physical sensor applications.

Published in:

Micro & Nano Letters, IET  (Volume:7 ,  Issue: 11 )

Date of Publication:

November 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.