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A wide dynamic range CMOS image sensor based on a new gamma correction technique

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4 Author(s)
Yeonseong Hwang ; Dept. Semicond. Sci., Dongguk Univ., Seoul, South Korea ; Jangwoo Lee ; Daeyun Kim ; Minkyu Song

Many kinds of wide dynamic range (WDR) CMOS Image Sensors (CIS) have been developed, such as a multiple sampling, a multiple exposure technique, and so on. However, those techniques have some drawbacks of noise increasing, large power consumption, and huge chip area. In this paper, a new Single-Slope ADC (SS-ADC) for gamma correction with a nonlinear counter is described. Since the proposed scheme is easily implemented with a simple algorithm, we can reduce power consumption and chip area drastically. Further, the new SS-ADC for gamma correction enhances the Dynamic Range (DR) by 24dB. The proposed ADC, which has been fabricated using a 0.13um CIS process, achieves a 57.6dB SNDR at 50kS/s.

Published in:

SoC Design Conference (ISOCC), 2012 International

Date of Conference:

4-7 Nov. 2012

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