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Overview of thermal studies on photonics devices for reliability, robustness and new design

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10 Author(s)
Yannick Deshayes ; IMS Lab., Univ. Bordeaux 1, Talence, France ; A. Royon ; R. Baillot ; L. Béchou
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This paper presents the main activities on reliability, robustness and failure of photonic devices. The approach is different if the system is manufactured of if it is developed or elaborated. The building reliability is exposed on the new photonic devices using for future numerical data storage for archiving. The robustness is deal with the laser transmitter in marketing position. Finely, the blue light emitting diode is treated with operational reliability. This paper has a main line on the model and measurement of thermal flow or temperature. Since 10 years and actually, the thermal flow is the main cause of degradation of photonic devices. But, additionally, in comparison with electronic devices, the light is the new parameter to take into account in the failure degradation. The blue light interaction with material, especially polymer, is important and the modification of fluorescence change can change function of the photonic devices. This paper underlines the kind of problems.

Published in:

Thermal Investigations of ICs and Systems (THERMINIC), 2012 18th International Workshop on

Date of Conference:

25-27 Sept. 2012