Cart (Loading....) | Create Account
Close category search window
 

CVPD: A tool based on a social network analysis to combating viruses propagation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mishra, S. ; Robot. & Artificial Intell. Lab., Indian Inst. of Inf. Technol., Allahabad, India ; Agrawal, U. ; Nandi, G.C.

It has been seen that Social network analysis is gaining its applicability in several areas like business, marketing, biology, disease modeling, and anti-terrorism. In this paper, we have discussed its practical application in the domain of computer network to identify distribution of computer viruses flowing through the network. To the best of our knowledge this is a novel idea and is based on the gSpan (Graph based substructure Pattern Mining) algorithm for identifying frequent pattern of viruses flowing in a particular region of connected nodes. This crusades make analysist enabled to deal with the problems and deploy more efficient antivirus in that region of nodes.

Published in:

Communication, Information & Computing Technology (ICCICT), 2012 International Conference on

Date of Conference:

19-20 Oct. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.