Referenced Items are not available for this document.
Welcome to the Signal Integrity Column! In this issue, Dr. Xiaoning Ye from Intel Corporation presents interesting error analysis with examples for de-embedding, a commonly used technique for removing the unwanted effects of test fixtures in vector network analyzer measurements.
Published in:
Electromagnetic Compatibility Magazine, IEEE
(Volume:1
,
Issue:
4
)
Date of Publication: Fourth Quarter 2012
- Page(s):
- 75
- ISSN :
- 2162-2264
- Digital Object Identifier :
- 10.1109/MEMC.2012.6397063
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 04 January 2013
- Issue Date :
- Fourth Quarter 2012
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