Cart (Loading....) | Create Account
Close category search window

Influence of test methods on dc flashover performance of ice-covered composite insulators and statistical analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Xingliang Jiang ; State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing, China ; Maoqiang Bi ; Jianlin Hu ; Zhijing Zhang
more authors

Operational statistics and studies have revealed that, the reduction of insulation strength of transmission line insulators caused by icing is one of the critical reasons of the power grid faults. This paper compares of various test methods for evaluating the flashover characteristic of ice-covered composite insulators. Two types of composite insulators, i.e. FXBW-±800/530 short sample and FXBW-110/100 are investigated. The influences of various test methods on flashover performance of ice-covered insulators are studied in an artificial climate chamber. The test results revealed the influences are significant. The average flashover voltage (Uav) using even raising method is highest, followed by the 50% withstand voltage (U50%) which is corresponding to up and down method, the lowest flashover voltage (Uf.min) using Ucurve method is the third, and the maximum withstand voltage (Uws) using the maximum withstand voltage method is the lowest. Through the statistical analysis, the U50% can be estimated by Uav and σav though the estimated value Ue (Ue=(Uav-k1σav)/( 1+k2δe)). The estimated errors (Ee) are less than 1.80% in this paper. Therefore, there is an intrinsic relationship among the test results obtained by using various test methods. This simplifies selection of the appropriate test method according to the testing specific circumstances.

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:19 ,  Issue: 6 )

Date of Publication:

December 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.