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Test requirements for embedded core-based systems and IEEE P1500

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1 Author(s)
Zorian, Y. ; LogicVision Inc., Princeton, NJ, USA

Chips comprising reusable cores, i.e. pre-designed Intellectual Property (IP) blocks, have become an important part of IC-based system design. Using embedded cores enables the design of high-complexity system-chips with densities as high as millions of gates on a single die. The increase in using pre-designed IP cores in system-chips adds to the complexity of test. To test system-chips adequately, test solutions need to be incorporated into individual cores and then the tests from individual cores need to be scheduled and assembled into a chip level test. However with the increased usage of cores from multiple and diverse sources, it is essential to create standard mechanisms to make core test plug-and-play possible. This paper discusses in general the challenges in testing core-based system-chips and describes their corresponding test solutions. It concentrates on the common test requirements and introduces the on-going standardization efforts, specifically under IEEE P1500 Working Group, which is meant to standardize the interface between a core test and its host the System-on-Chip

Published in:

Test Conference, 1997. Proceedings., International

Date of Conference:

1-6 Nov 1997