Referenced Items are not available for this document.
This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores
Published in:
Test Conference, 1997. Proceedings., International
Date of Conference: 1-6 Nov 1997
- Page(s):
- 69 - 78
- Meeting Date :
- 01 Nov 1997-06 Nov 1997
- ISSN :
- 1089-3539
- Print ISBN:
- 0-7803-4209-7
- INSPEC Accession Number:
- 5870069
- Conference Location :
- Washington, DC
- Digital Object Identifier :
- 10.1109/TEST.1997.639596
- Product Type:
- Conference Publications
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