Cart (Loading....) | Create Account
Close category search window

Assessment and Comparative Analysis of RDF Visualization Technology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Shuren Li ; Acad. of Disaster Reduction & Emergency Manage., Beijing Normal Univ., Beijing, China ; Tao Yang ; Na Hong ; Shiting Xu

RDF visualization technology provides an easy approach to analyze and manage the data for the application of the Semantic Web, which is convenient for the user to perform the specific interactive operation to the extremely abstract Semantic Web. On the basis of a detailed investigation of the RDF visualization approaches and related software, this paper mainly introduces the progress and shortcomings of the current RDF visualization technology, especially from the point of view of the evaluation mechanism of RDF visualization technology and the comparative analysis of various performance parameters of the mainstream tools, providing a reference for the scientific research work of the ontology field.

Published in:

Computer Science & Service System (CSSS), 2012 International Conference on

Date of Conference:

11-13 Aug. 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.