Cart (Loading....) | Create Account
Close category search window

Development of a Precision Scanning Optical Pulser for Low-Temperature Particle Detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Jaeckel, F.T. ; Dept. of Phys. & Astron., Univ. of New Mexico, Albuquerque, NM, USA ; Le, L.N. ; Martin, K.W. ; Boyd, S.T.P.

Gamma-ray spectroscopy using low-temperature microcalorimeter arrays has demonstrated breakthrough energy resolution, establishing an important new technique for the precise characterization of radioactive samples. However, the extraordinary dynamic range of these pixels, spanning tens of electronvolts to hundreds of kiloelectronvolts, places stringent requirements on the calibration accuracy of each pixel. In this report, we describe the design, development, and initial reflectivity-map testing of a new optical pulser intended for the precise determination of energy calibrations of microcalorimeter pixels and pixel arrays. A high-resolution XYZ scanner combined with 3 K optics achieving a 3-μm focused spot permit in situ imaging and precise placement of the energy deposition on the detector. Absolute absorbed power can be calibrated via a precision measurement of detector thermal stand-off.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:23 ,  Issue: 3 )

Date of Publication:

June 2013

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.