Skip to Main Content
Physical attacks against cryptographic modules on embedded systems are different with theoretical analysis. Side-channel attacks, which are noninvasive physical attacks, exploit the measurable parameters of devices. In this study, we have developed a cryptographic LSI environment for testing side-channel attacks. The environment is designed such that small fluctuations in LSI power consumption can be measured. A printed circuit board, and control hardware and software are developed, and are available on our website to provide a uniform environment for side-channel testing of LSIs. Details of the developed environment are described in this paper, and its performance in measurements and tests is demonstrated through an experiment that replicates a side-channel attack.