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This paper presents an efficient map generation technique for evaluating the intensity of electromagnetic (EM) radiation associated with information leakage for cryptographic devices at the printed circuit board level. First, we investigate the relation between the intensity of the overall EM radiation and the intensity of EM information leakage on a cryptographic device. For this purpose, we prepare a map of the magnetic field on the device by using an EM scanning system, after which we perform correlation electromagnetic analysis (CEMA) at all measurement points on the device, including points above the cryptographic module. The examined device is a standard evaluation board for cryptographic modules (side-channel attack standard evaluation board), where a cryptographic circuit is implemented on one of the field-programmable gate arrays on the board. With this experiment, we demonstrate that both an EM radiation map and an information leakage map can be generated simultaneously by scanning the board only once. We also confirm that the generated map is in good agreement with the corresponding map obtained from exhaustive CEMAs.