Cart (Loading....) | Create Account
Close category search window
 

Generalized Anisotropic Stratified Surface Sampling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Quinn, J.A. ; Dept. of Comput. Sci. Inf., Cardiff Univ., Cardiff, UK ; Langbein, F.C. ; Yu-Kun Lai ; Martin, R.R.

We introduce a novel stratified sampling technique for mesh surfaces that gives the user control over sampling density and anisotropy via a tensor field. Our approach is based on sampling space-filling curves mapped onto mesh segments via parametrizations aligned with the tensor field. After a short preprocessing step, samples can be generated in real time. Along with visual examples, we provide rigorous spectral analysis and differential domain analysis of our sampling. The sample distributions are of high quality: they fulfil the blue noise criterion, so have minimal artifacts due to regularity of sampling patterns, and they accurately represent isotropic and anisotropic densities on the plane and on mesh surfaces. They also have low discrepancy, ensuring that the surface is evenly covered.

Published in:

Visualization and Computer Graphics, IEEE Transactions on  (Volume:19 ,  Issue: 7 )

Date of Publication:

July 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.