Cart (Loading....) | Create Account
Close category search window
 

Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Voyiatzis, I. ; Dept. of Inf., TEI of Athens, Athens, Greece ; Axiotis, K. ; Papaspyrou, N. ; Antonopoulou, H.
more authors

Current trends in VLSI designs necessitate low power during both normal system operation and testing activity. Traditional Built-in Self Test (BIST) generators rise unnaturally the power consumption during testing, boosting the need to add low-power solutions to the arsenal of BIST pattern generators. In this paper, the utilization of gray code generators is proposed as a low-power BIST solution. More precisely, we show how the time required to apply a given test pattern can be decreased, by switching between different gray sequences during the application of the test set. Experimental results indicate that the time required to embed the test set within a low-power sequence is reduced to almost 50%, compared to a previously proposed solution.

Published in:

Informatics (PCI), 2012 16th Panhellenic Conference on

Date of Conference:

5-7 Oct. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.