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NBTI mitigation by Dynamic Partial Reconfiguration

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7 Author(s)
Di Carlo, S. ; Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy ; Galfano, S. ; Gambardella, G. ; Indaco, M.
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FPGAs achieve smaller geometries and their reliability is becoming a severe issue. Non-functional properties, as Negative Bias Temperature Instability, affect the device functionality. In this work a novel methodology to address this issue is described, exploiting FPGAs flexibility. Dynamic Partial Reconfiguration is used to minimize aging impact on FPGAs' configuration memory.

Published in:

Electronics Conference (BEC), 2012 13th Biennial Baltic

Date of Conference:

3-5 Oct. 2012

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