By Topic

Time-Domain Algorithm for Locating Evolving Faults

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Saurabh Kulkarni ; Department of Electrical and Computer Engineering, University of Texas, Austin ; Surya Santoso

Evolving faults are faults beginning in one phase of a distribution circuit and spreading to another phase after a few cycles. This paper develops a time-domain algorithm for estimating the location of such faults. The algorithm is divided into two parts, namely, the single line-to-ground portion of the fault and the line-to-line-to-ground portion of the fault. The arc voltage that exists during faults is taken into consideration while deriving this methodology. For the single line-to-ground portion of the fault, the distance to the fault is estimated in terms of the loop or self-reactance between the monitor and the fault. On the other hand, for the line-to-line-to-ground and line-to-line portion of the fault the distance is estimated in terms of the positive-sequence reactance. The reactance-to-fault estimate is more robust than that of the resistance-to-fault, because it is unaffected by fault resistance. Two evolving fault cases and two line-to-line fault cases are analyzed in detail and the error in the location estimates is found to be below 10% in each case. Ten additional cases are analyzed and linear regression analysis is conducted to demonstrate the accuracy of the fault location estimates.

Published in:

IEEE Transactions on Smart Grid  (Volume:3 ,  Issue: 4 )