Cart (Loading....) | Create Account
Close category search window
 

Experimental Device to Electromechanically Characterize 3-Strand \hbox {Nb}_{3}\hbox {Sn} Samples Under Transverse Load

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Chiesa, L. ; Dept. of Mech. Eng., Tufts Univ., Medford, MA, USA ; Derman, K. ; Tiening Wang ; Allen, N.C.
more authors

Triplet cables are the basic cable element of CICC cables, and understanding their electromechanical behaviors under transverse loads is of critical importance to evaluate the electromagnetic behaviors of large cables. This paper describes a new compact experimental device to characterize electromechanically single strand and triplet cable samples as well as HTS tapes under transverse loads. The device has been built and tested with significant reduction of the cost of the experiment compared to a previously used hairpin sample device. Critical current measurements as a function of transverse mechanical load at 12 T were successfully performed on triplets using ITER Nb3Sn wire. The transversely loaded section of the samples is 110 mm in length, longer than the typical twist pitch lengths of first-stage triplets of CICC. The load is applied by using a gear system driven by a 1/2 HP motor. A wedge, vertically displaced by the motor, moves other pressing components transversely. Those parts ultimately apply transverse compression on the cable. A load cell and an extensometer are used to measure the absolute vertical load and displacement, respectively. Limitations and challenges of this compact transverse load device design are discussed together with some experimental results.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:23 ,  Issue: 3 )

Date of Publication:

June 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.