By Topic

Comparison of System-Level ESD Design Methodologies—Towards the Efficient and ESD Robust Design of Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Scholz, M. ; Interuniv. Microelectron. Centre (Imec) vzw, Leuven, Belgium ; Shih-Hung Chen ; Vandersteen, G. ; Linten, D.
more authors

Three system-level electrostatic discharge (ESD) design methodologies are compared using an RF buffer amplifier as case study. First, the system-level ESD protection is designed with datasheet information. The obtained overdesigned ESD protection is optimized with the System-Efficient ESD Design (SEED) methodology. The SEED-based protection design is further optimized using human metal model testing and transient simulations. The final ESD protection design requires five times less area on the application board, and the capacitive loading is six times lower than when designing with datasheet information.

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:13 ,  Issue: 1 )