By Topic

Design of a conflict detection algorithm for the Center/TRACON automation system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Isaacson, D.R. ; NASA Ames Res. Center, Moffett Field, CA, USA ; Erzberger, Heinz

An algorithm for detecting and analyzing potential enroute conflicts has been designed and implemented within the Center-TRACON Automation System (CTAS). The design uses the 4D trajectories provided by CTAS to produce a set of probable future conflicts, and assists the enroute sector controller in efficiently resolving these conflicts. Conflicts are detected via comparisons of trajectories at closely spaced time instants, with measures taken to limit the computations required to complete the search. Performance tests indicate more than 800 aircraft can be processed by the conflict detection and analysis algorithm within a search cycle of 10 seconds. This suggests that the search algorithm easily meets the performance requirements for an automated conflict detection and resolution tool in the current air traffic system. The algorithm includes a trial resolution functionality which automatically detects conflicts of proposed resolutions, and gives near instantaneous feedback to controller input. Field evaluation of the Conflict Probe will be conducted at the Denver and Fort Worth Air Route Traffic Control Centers (ARTCC) beginning in September, 1997

Published in:

Digital Avionics Systems Conference, 1997. 16th DASC., AIAA/IEEE  (Volume:2 )

Date of Conference:

26-30 Oct 1997