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Foreword for the Special Issue on ESD Technology

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3 Author(s)
Gianluca Boselli ; Analog ESD Group Manager, Texas Instruments Incorporated, Dallas, TX, USA ; Ming-Dou Ker ; Charvaka Duvvury

The four invited papers in this special issue focus on ESD technology. The first three are revised papers that were presented at the 2011 EOS/ESD Symposium, while the final ESD paper is an invited review paper to describe ESD protect design issues in state-of-the-art high voltage devices.

Published in:

IEEE Transactions on Device and Materials Reliability  (Volume:12 ,  Issue: 4 )