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Noise-assisted data processing in measurement science: Part two

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3 Author(s)
Ruqiang Yan ; Instrum. Sci. & Technol., Southeast Univ., Nanjing, China ; Rui Zhao ; Gao, R.X.

In Part One of this tutorial [1], we introduced stochastic resonance-based data processing, where a weak signal can be amplified and detected by deliberately adding a small amount of noise to a nonlinear bistable or multi-stable system. In this part of the tutorial, we introduce another noise-assisted data processing technique, ensemble empirical mode decomposition (EEMD), which has attracted increasing attention in various science and engineering domains including measurement science.

Published in:

Instrumentation & Measurement Magazine, IEEE  (Volume:15 ,  Issue: 6 )