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Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

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We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

Published in:

Applied Physics Letters  (Volume:101 ,  Issue: 22 )

Date of Publication:

Nov 2012

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