Cart (Loading....) | Create Account
Close category search window
 

A Comprehensive Methodology to Rate SETs of Complex Analog and Mixed-Signal Circuits Demonstrated on 16-bit A-to-D Converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Zanchi, A. ; Aeroflex Colorado Springs, Colorado Springs, CO, USA ; Buchner, S. ; Hisano, S. ; Wilson, A.
more authors

3-D histograms grading the frequency of occurrence of pulsed-laser and heavy-ion induced ASETs against their durations and amplitudes are collected and interpreted on both radiation-hardened and commercial 16-bit ADCs operated at 10 MSps. The histograms encompass traditional cross-section tabulations, modeled after digital upset scoring techniques based on counting events that exceed an arbitrary threshold; yet, they provide a more exhaustive alternative. This data representation technique offers an intuitive visual assessment of the circuit response to radiation, which helped us identify in heavy-ion test results the same trend of ASET width increase, peak decrease versus LET recently published for laser data. The method proposed in this work hinges on a database structure that allows for the definition of custom figures of merit, providing a comprehensive tool for rating radiation hardness in complex analog and mixed-signal circuits.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 6 )

Date of Publication:

Dec. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.