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Single Event Effects in Power MOSFETs Due to the Secondary Neutron Environment in a Proton Therapy Center

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4 Author(s)
Cascio, E.W. ; Francis H. Burr Proton Therapy Center, Massachusetts Gen. Hosp., Boston, MA, USA ; Riley, K.J. ; McCormack, J. ; Flanagan, R.

Secondary neutron induced single event burnouts (SEB) in power MOSFETs to be installed in an X-ray generator located in a proton therapy treatment vault are characterized. This is done using both accelerated and in situ testing. Experimental techniques and schematics are presented that allow non-destructive testing of multiple MOSFETs in parallel for in situ real time measurements.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 6 )

Date of Publication:

Dec. 2012

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