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Correlation of Dynamic Parameter Modification and ASET Sensitivity in a Shunt Voltage Reference

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10 Author(s)
Roche, N.J.-H. ; IES, Univ. Montpellier 2, Montpellier, France ; Buchner, S.P. ; Dusseau, L. ; Kruckmeyer, K.
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Analog Single Event Transients (ASETs) in two different shunt voltage references used in power management systems are investigated. Little has been published regarding how the dynamic parameter changes induced by external circuit design, such as time constant, damping coefficient or natural frequency affect ASET shapes. Modifications of the dynamic parameters of the circuit are measured by step response measurement. A correlation between dynamic parameters and ASET laser testing results is proposed. This study establishes the correlation between the dynamic parameters of a shunt voltage reference and ASET parameters such as pulse duration, and positive and negative amplitude.

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Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 6 )