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Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology

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9 Author(s)
Jagannathan, S. ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA ; Loveless, T.D. ; Bhuva, B.L. ; Gaspard, N.J.
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In this paper, the alpha-particle induced soft error rate of two flip-flops are investigated as a function of operating frequency between 80 MHz and 1.2 GHz. The two flip-flops-an unhardened D flip-flop and a hardened pseudo-DICE flip-flop were designed in a TSMC 40 nm bulk CMOS technology. The error rates of both flip-flops increase with frequency. Analyses show that an internal single-event transient based upset mechanism is responsible for the frequency dependence of the error rates.

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Nuclear Science, IEEE Transactions on  (Volume:59 ,  Issue: 6 )