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Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

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13 Author(s)
Cochran, D.J. ; MEI Technol., Inc., Seabrook, TX, USA ; Boutte, A.J. ; Dakai Chen ; Pellish, J.A.
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Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear, and hybrid devices.

Published in:
Radiation Effects Data Workshop (REDW), 2012 IEEE

Date of Conference: 16-20 July 2012

Page(s):
1 - 9
ISSN :
2154-0519
Print ISBN:
978-1-4673-2730-5
INSPEC Accession Number:
13135943
Conference Location :
Tucson, AZ
Digital Object Identifier :
10.1109/REDW.2012.6353741
Product Type:
Conference Publications

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