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Single Event Upset Characterization of the Virtex-6 Field Programmable Gate Array Using Proton Irradiation

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2 Author(s)
Hiemstra, D.M. ; MDA, Brampton, ON, Canada ; Kirischian, V.

Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Virtex-6 FPGA are presented. Upset rates in the space radiation environment are estimated.

Published in:

Radiation Effects Data Workshop (REDW), 2012 IEEE

Date of Conference:

16-20 July 2012