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An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone

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6 Author(s)
Tianqi Li ; EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA ; Maeshima, J. ; Shumiya, H. ; Pommerenke, D.J.
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An LED circuit of a cell phone is analyzed using the System-Efficient-ESD-Design (SEED) methodology. The method allows simulation of the ESD current path, and the interaction mechanisms between the clamp and the on-chip ESD protection circuit. The I-V curve and the non-linear behavior under high current pulses of every component including R, L, C, and ferrite beads are measured and modeled. By combining all of the component models, a complete circuit model is built for predicting the circuit behavior and damaging threshold at a given setting-voltage of a Transmission Line Pulser (TLP).

Published in:

Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on

Date of Conference:

6-10 Aug. 2012

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