Cart (Loading....) | Create Account
Close category search window

Processor efficient parallel algorithms for the two disjoint paths problem, and for finding a Kuratowski homeomorph

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Khuller, S. ; Dept. of Comput. Sci., Cornell Univ., Ithaca, NY, USA ; Mitchell, S.G. ; Vazirani, Vijay V.

Given a graph G and two pairs of vertices s1, t1 and s2, t2, the two disjoint paths problem asks for vertex-disjoint paths connecting si with ti, i=1, 2. A fast parallel (NC) algorithm is given for this problem, which has applications in certain routing situations. If G is nonplanar, an algorithm that finds a Kuratowski homeomorph in G (i.e. a subgraph homeomorphic to K3.3 or K5) is given. This complements the known NC planarity algorithms, which give a planar embedding in the positive case; the algorithm provides a certificate of nonplanarity in the negative case. Both algorithms are processor efficient; in each case, the processor-time product is within a polylogarithmic factor of the best known sequential algorithm

Published in:

Foundations of Computer Science, 1989., 30th Annual Symposium on

Date of Conference:

30 Oct-1 Nov 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.