By Topic

Return loss measurements of WDM filters with tunable coherent optical frequency-domain reflectometry

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
J. P. Von Der Weid ; Univ. Catolica de Rio de Janeiro, Brazil ; R. Passy ; A. O. Forno ; B. Huttner
more authors

Reflectivity measurements of wavelength-division multiplexed (WDM) filters were performed with polarization independent coherent optical frequency domain reflectometry (C-OFDR). The spectral resolution of 0.012 mn allowed to characterize side lobe spacing and reflectivity with 90-dB dynamic range. The off-channel reflectivity was also measured for estimating the interchannel crosstalk in WDM systems and the experimental results were fitted to a theoretical equation, extracting the physical parameters of the filter.

Published in:

IEEE Photonics Technology Letters  (Volume:9 ,  Issue: 11 )