Cart (Loading....) | Create Account
Close category search window
 

Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
2 Author(s)
Chien, W ; Semiconductor Manufacturing International Corporation, Shanghai, China ; Li, M

Yield and reliability susceptibility would become obvious with the increase in the complexity of manufacturing technology. Yield and reliability enhancement is always our pursuit. However, tradeoffs between yield and reliability, or between Fab and assembly house, are often observed during the technology development (TD) phase, which will lengthen the production ramp-up period, and further affect the product profit. To shorten the time-to-market of a new technology, some practical experiences on solving tradeoffs in semiconductor manufacturing are reported; a generic procedure to handle the tradeoff problem is proposed, and the effectiveness was also proved. Early detection capability, baseline knowledge management, fully understanding customers' requirements, and effectively consolidating all parties' efforts are considered to play key roles in the procedure. It is believed that such a procedure can be also applied to solve the tradeoff problem in other industries.

Published in:

Reliability, IEEE Transactions on  (Volume:61 ,  Issue: 4 )

Date of Publication:

Dec. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.