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A new technique for the extraction of SPICE-type equivalent circuits from measured or computed S-parameters of microstrip components and discontinuities

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2 Author(s)
Werner, P.L. ; Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA ; Mittra, R.

This paper introduces a new technique based on the application of the Genetic Algorithm (GA) for extracting the equivalent circuits for measured or computed S-parameters that can be inserted into SPICE simulations. The GA is a robust optimization tool that is shown to yield excellent result for the sample test case of a right angle bend in a microstrip line.

Published in:

Electrical Performance of Electronic Packaging, 1997., IEEE 6th Topical Meeting on

Date of Conference:

27-29 Oct. 1997