Cart (Loading....) | Create Account
Close category search window

An operating context-sensitive approach to fault detection of mechatronic systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kurki, M. ; VTT, Oulu, Finland ; Hirvinen, J.

A fault detection approach designed specifically for mechatronic systems is presented. In the approach the fault detection features are integrated with the control software. The authors have defined an object-oriented structure which matches the event-driven hierarchy of the control software. The event-driven control software, the object hierarchy, and fault detection tasks are linked together to form an executable system. The fault detection tasks check both analog and switch sensors in a context-dependent manner. Duration times of the specified states and the frequency of exceptional situations are compared to normal operation. The strengths of this approach are: quick and easy implementation and configuration, easy integration and embedding, no need to develop any extra model (qualitative, causal, etc.), and suitability to few sensor applications because of the efficient utilization of the operating context

Published in:

Tools with Artificial Intelligence, 1993. TAI '93. Proceedings., Fifth International Conference on

Date of Conference:

8-11 Nov 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.