Cart (Loading....) | Create Account
Close category search window
 

Development of a smart grid test bed and applications in PMU and PDC testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

The electric power system is moving towards the smart grid development for improved reliable, secure and economic operation. Many researchers are now concentrating their research that is aimed at upgrading the power system by using state-of-the-art computer based online monitoring and control tools along with advanced communication facilities. Implementation of such a system requires enhanced testing and validation of smart grid technologies as well as development of new approaches to fully utilize the capabilities of these technologies. This paper is a modest attempt to present the summary of the effort to model a smart power grid in real time by developing a “smart grid test bed”. Additionally, some of the applications of the developed test bed have been briefly described, with special emphasis on testing of synchrophasor devices like PMUs and PDCs.

Published in:

North American Power Symposium (NAPS), 2012

Date of Conference:

9-11 Sept. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.