Cart (Loading....) | Create Account
Close category search window

Finding specific RNA sequence motifs using digital filters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Rajasekhar, K. ; Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada ; Ahmad, M.O. ; Devabhaktuni, V.

Local distinct structural elements, called motifs, in RNA sequences are strictly correlated with their function. Due to the enormous increase of genomic data in recent times, highly effective computational algorithms are in greater demand for identification of such motifs in RNA sequences. In this work, a digital signal processing approach using statistically optimal null filter (SONF) is developed for finding specific motifs in an RNA sequence. The instantaneous matched filter in SONF determines the degree of local alignment between the motif and the windowed RNA sequence being compared. Through example the effectiveness of the proposed approach is illustrated. In particular, the proposed method is highly efficient in identifying similar motifs in large RNA sequences.

Published in:

Electrical & Computer Engineering (CCECE), 2012 25th IEEE Canadian Conference on

Date of Conference:

April 29 2012-May 2 2012

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.