By Topic

Results From Testing of 145 3D Position-Sensitive, Pixelated CdZnTe Detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yvan A. Boucher ; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI, USA ; Jason Jaworski ; Willy Kaye ; Feng Zhang
more authors

Testing of 20 × 20 × 15 mm3 3D position sensitive, CdZnTe detectors grown by Redlen Technologies Inc. has shown that 98 out of the 145 detectors analyzed achieved sub-1% FWHM at 662 keV for single-pixel events. Improvements in the detector performance over time reflect the improvements in detector growth and fabrication over the past several years. In addition to the spectroscopic performance of the detectors, the imaging performance of each detector was also quantified. The results show that imaging is weakly correlated to the spectroscopic performance, and more strongly correlated to the accuracy of the depth reconstruction. Other detector issues such as gain deficit and gain variation are also discussed.

Published in:

IEEE Transactions on Nuclear Science  (Volume:59 ,  Issue: 6 )