Cart (Loading....) | Create Account
Close category search window
 

A Stepped-Pole Writer to Minimize Side Erasure on Barium Ferrite Tape

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Jubert, P. ; IBM Res. - Almaden, San Jose, CA, USA ; Rothuizen, H.E. ; Delenia, E. ; Frommer, J.
more authors

Side erasure is investigated for non-oriented and perpendicularly oriented barium ferrite particulate tape media without a soft-underlayer. While notching is efficient to avoid side writing from the leading pole, the perpendicular head fields originating from the outer edge of the trailing pole result in curved transitions and non-negligible side erasure. We find that such side erasure effects can be suppressed by recessing part of the trailing pole, thereby forming a stepped pole. Magnetic force microscopy and cross-track profiling experiments demonstrate the efficacy of this novel stepped-pole writer design to minimize side writing effects in non-oriented and perpendicular particulate tape media. This writer geometry will enable tape recording at 50 ktpi and beyond.

Published in:

Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 11 )

Date of Publication:

Nov. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.